Design pattern

Results: 1245



#Item
911GSN / Initialisms / Knowledge / Safety case / Argumentation theory / Software development process / Change management / Software design pattern / Critical thinking / Safety / Science / Systems engineering

Arguing Safety – A Systematic Approach to Managing Safety Cases Timothy Patrick Kelly Submitted for the degree of Doctor of Philosophy

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Source URL: www-users.cs.york.ac.uk

Language: English - Date: 2003-03-12 05:53:21
912Synopsys / Signoff / Static timing analysis / Electronic engineering / Electronic design automation / Automatic test pattern generation

Success Story Synopsys and STMicroelectronics TetraMAX Small Delay Defect ATPG Boosts Test Quality at STMicroelectronics

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Source URL: www.synopsys.com

Language: English - Date: 2014-11-07 14:32:25
913Integrated circuits / Electronic design / Automatic test pattern generation / Scan chain / Power gating / Electronic design automation / Power supply / Iddq testing / Application-specific integrated circuit / Electronic engineering / Electronics / Design

White Paper Testing Low Power Designs with Power-Aware Test Manage Manufacturing Test Power Issues with DFTMAX™ and TetraMAX® April 2010

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Source URL: www.synopsys.com

Language: English - Date: 2014-11-07 14:31:30
914Electronic design automation / Automatic test pattern generation / Integrated circuits / Maintenance / Electronic design / Fault / Failure analysis / Semiconductor fault diagnostics / Design for testing / Electronic engineering / Geology / Design

White Paper Using TetraMAX® Physical Diagnostics for Advanced Yield Analysis Improving Defect Isolation with Layout Data January 2010

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Source URL: www.synopsys.com

Language: English - Date: 2014-11-07 14:31:30
915Electronic design automation / Hillsboro /  Oregon / Synopsys / Physical design / Yield / Automatic test pattern generation / Test engineer / Electronic engineering / Mechanics / Physics

Datasheet Yield Explorer Design-centric yield management Identify and eliminate

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Source URL: www.synopsys.com

Language: English - Date: 2014-11-07 14:34:57
916Electronic design / Integrated circuits / Electronics manufacturing / Automatic test pattern generation / Design closure / Test compression / Physical design / Scan chain / Timing closure / Electronic engineering / Electronic design automation / Electronics

White Paper Synthesis-Based Test for Maximum RTL Designer Productivity November 2010

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Source URL: www.synopsys.com

Language: English - Date: 2014-11-07 14:32:21
917Integrated circuits / Electronic design / Software testing / Automatic test pattern generation / Scan chain / Code coverage / Automatic test equipment / Fault coverage / Electronic engineering / Electronics / Electronic design automation

Datasheet DFTMAX Ultra Compression for Highest Test Quality and Lowest Test Cost Overview

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Source URL: www.synopsys.com

Language: English - Date: 2014-11-07 14:32:25
918Arts / Cosmetics / Fashion design / Model / Cosmetology / Fashion / Pattern / Clothing / Sewing / Culture

PDF Document

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Source URL: saeu.sc.edu

Language: English - Date: 2011-02-28 12:15:47
919Electronic design automation / Electronic design / Integrated circuits / Scan chain / Automatic test pattern generation / Fault coverage / Electronics manufacturing / Test compression / Design for testing / Electronic engineering / Electronics / Design

White Paper DFTMAX Ultra New Technology to Address Key Test Challenges September 2013

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Source URL: www.synopsys.com

Language: English - Date: 2014-11-07 14:32:17
920Computer-aided design / Pattern / Graphics / Clothing / Design / Visual arts

MDC Courses - Existing to New Original Course ID COM1010 COM1020

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Source URL: www.education.alberta.ca

Language: English - Date: 2010-08-06 12:53:08
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